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Investigation of Filamentary Current Fluctuations Features in the High-Resistance State of Ni/HfO 2 -Based RRAM by Gonzalez, Mireia Bargallo; Martin-Martinez, Javier; Maestro, Marcos; Acero, Maria Cruz; Nafria, Montserrat; Campabadal, Francesca is a Engineering article available to read on EtoBox.

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Author
Gonzalez, Mireia Bargallo; Martin-Martinez, Javier; Maestro, Marcos; Acero, Maria Cruz; Nafria, Montserrat; Campabadal, Francesca
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
Published
2016
Language
EN
Field
Engineering (Physical Sciences)

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