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About this scholarly article
SPIE Proceedings [SPIE International Symposium on Optoelectonics and Microelectronics - Nanjing, China (Wednesday 7 November 2001)] Advances in Microelectronic Device Technology - ESD protection design for advanced CMOS by Huang, Jin B.; Wang, Gewen; Tong, Qin-Yi; Goesele, Ulrich M. is a scholarly article available to read on EtoBox.
- Author
- Huang, Jin B.; Wang, Gewen; Tong, Qin-Yi; Goesele, Ulrich M.
- Publisher
- SPIE
- Published
- 2001
- Language
- EN
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