About this scholarly article

16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011) - The impact of inverse narrow width effect on sub-threshold device sizing by Zhou, Jun; Jayapal, Senthil; Stuyt, Jan; Huisken, Jos; de Groot, Harmke is a scholarly article available to read on EtoBox.

Author

Zhou, Jun; Jayapal, Senthil; Stuyt, Jan; Huisken, Jos; de Groot, Harmke

Publisher

IEEE

Published

2011

Language

EN