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About this Engineering article
On the Characterization of Thin Film-only Mechanical Property Based on the Indentation Image Analysis by Lee, Yun-Hee ;Kim, Yong-Il ;Jang, Hoon-Sik ;Nahm, Seung-Hoon ;Kim, Ju-Young ;Kwon, Dongil ;Jang, Jae-il is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Lee, Yun-Hee ;Kim, Yong-Il ;Jang, Hoon-Sik ;Nahm, Seung-Hoon ;Kim, Ju-Young ;Kwon, Dongil ;Jang, Jae-il
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 2006
- Language
- EN
- Field
- Engineering (Physical Sciences)