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2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225) - Multi aging test for polymer materials by Hashiguchi, T.; Otsubo, M.; Yamashita, S.; Anami, N.; Honda, C.; Takenouchi, O.; Hashimoto, Y.; Nakamura, M. is a scholarly article available to read on EtoBox.

Author
Hashiguchi, T.; Otsubo, M.; Yamashita, S.; Anami, N.; Honda, C.; Takenouchi, O.; Hashimoto, Y.; Nakamura, M.
Publisher
IEEE
Published
2001
Language
EN

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