About this scholarly article

SPIE Proceedings [SPIE Astronomical Telescopes and Instrumentation - Waikoloa, HI (Thursday 22 August 2002)] Interferometry for Optical Astronomy II - Array metrology system for an optical long-baseline interferometer by Hutter, Donald J.; Elias II, Nicholas M.; Traub, Wesley A. is a scholarly article available to read on EtoBox.

Author

Hutter, Donald J.; Elias II, Nicholas M.; Traub, Wesley A.

Publisher

SPIE

Published

2003

Language

EN