About this scholarly article

2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Failure Analysis and Improvement of the Body Diode in Superjunction Power MOSFET by Ren, Min; Yang, Mengqi; Zhong, Shengrong; Xie, Chi; Li, Zehong; Gao, Wei; Zhang, Jinping; Zhang, Bo is a scholarly article available to read on EtoBox.

Author

Ren, Min; Yang, Mengqi; Zhong, Shengrong; Xie, Chi; Li, Zehong; Gao, Wei; Zhang, Jinping; Zhang, Bo

Publisher

IEEE

Published

2018

Language

EN