About this scholarly article

SPIE Proceedings [SPIE Video Communications and Fiber Optic Networks - Berlin, Federal Republic of Germany (Sunday 4 April 1993)] Passive Fiber Optic Components and Their Reliability - Novel low-cost approach to test large port-count fiber optic components by Agarwal, Arun K.; Tekippe, Vincent J.; Varachi, Jr., John P. is a scholarly article available to read on EtoBox.

Author

Agarwal, Arun K.; Tekippe, Vincent J.; Varachi, Jr., John P.

Publisher

SPIE

Published

1993