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About this Engineering article
1178. Current and breakdown characteristics of amorphous SIO2 in metal-oxide-semiconductor structure: A Plenier and B K Chakraverty, International Conf Phys Chem Semiconductors Heterojunctions Layer Structure, Vol 4, Akademiai Kiado Budapest 1971, 161–170 is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0042-207X)
- Published
- 1972
- Language
- EN
- Field
- Engineering (Physical Sciences)