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About this Engineering article
An Empirical Set of Metrics for Embedded Systems Testing by Alongi, A.; Conti, V.; Vitello, G.; Vitabile, S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Alongi, A.; Conti, V.; Vitello, G.; Vitabile, S.
- Publisher
- Institute of Electrical and Electronics Engineers; IEEE Computer Society; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 2168-2356)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)
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