About this scholarly article

ECS Transactions - Investigating Electronic and Chemical Properties of Ge/GeOxNy/HfO2 Gate Stacks : High-Resolution Photoelectron Spectroscopy Using Synchrotron Radiation by Renault, Olivier J.; Martinez, Eugénie; Fourdrinier, Lionel; Clavelier, Laurent; Barrett, Nick; Le Royer, Cyrille; Crotti, Corrado is a scholarly article available to read on EtoBox.

Author

Renault, Olivier J.; Martinez, Eugénie; Fourdrinier, Lionel; Clavelier, Laurent; Barrett, Nick; Le Royer, Cyrille; Crotti, Corrado

Publisher

ECS

Published

2006

Language

EN