About this scholarly article

Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - A review of near infrared photon emission microscopy and spectroscopy by Phang, J.C.H.; Chan, D.S.H.; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J. is a scholarly article available to read on EtoBox.

Author

Phang, J.C.H.; Chan, D.S.H.; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J.

Publisher

IEEE

Published

2005

Language

EN