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What is AFM Basics and Operation Tutorial about?

Atomic force microscopy (AFM) provides extremely high-resolution imaging of surfaces down to the atomic scale. An AFM uses a cantilever with a sharp tip that is raster scanned across a sample surface. Interactions between the tip and surface are measured by changes in cantilever deflection which is monitored using a laser beam and photodetector. Feedback control maintains a constant force between the tip and surface by adjusting the Z position based on deflection signals. Piezoelectric materials precisely c

Author

atulkrsharma

Language

EN