About this document

IED Fault Records Analysis 2025 by PATEL AKASH is a document available to read on EtoBox.

The document contains fault records uploaded from an IED by Dell on 11/11/2025, detailing various fault numbers, timestamps, and electrical parameters such as current, voltage, and frequency. Each fault entry includes specific measurements for differential and bias currents, as well as protection settings and operational times. The records indicate different conditions and performance metrics for the electrical system during the specified faults.

Author

PATEL AKASH

Language

EN