Skip to content

Opening book details…

About this Engineering article

Raman Spectroscopy of Surface Layers on Crystalline Silicon by J. C. Tsang is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
J. C. Tsang
Publisher
AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0734-211X)
Published
1985
Field
Engineering (Physical Sciences)

More by J. C. Tsang

Browse all works by J. C. Tsang