About this scholarly article

SPIE Proceedings [SPIE International Symposium on Optoelectonics and Microelectronics - Nanjing, China (Wednesday 7 November 2001)] Fiber Optics and Optoelectronics for Network Applications - Reliability analysis based on membership cloud model in distributed optical fiber industrial network by Huang, Haifeng; Sun, Xiaohan; Dai, Wen; Zhang, Mingde; Liu, Jian; Wang, Zhigong is a scholarly article available to read on EtoBox.

Author

Huang, Haifeng; Sun, Xiaohan; Dai, Wen; Zhang, Mingde; Liu, Jian; Wang, Zhigong

Publisher

SPIE

Published

2001