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Surface and Thin Film Analysis (A Compendium of Principles, Instrumentation, and Applications) by Friedbacher, Gernot; Bubert, Henning is a scholarly article available to read on EtoBox.

What is Surface and Thin Film Analysis (A Compendium of Principles, Instrumentation, and Applications) about?

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP), and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry

Author

Friedbacher, Gernot; Bubert, Henning

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Published

2011

Language

EN

ISBN

9783527636938