About this scholarly article

2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) - Using process experienced correlation table to improve the accuracy and reliability of data mining for yield improvement by Haw-Jyue Luo, ; Wang, S.R.; Chen, C.C.; Hung-En Tai, ; Chen-Fu Chien, ; Pei-Nong Chen, is a scholarly article available to read on EtoBox.

Author

Haw-Jyue Luo, ; Wang, S.R.; Chen, C.C.; Hung-En Tai, ; Chen-Fu Chien, ; Pei-Nong Chen,

Publisher

IEEE

Published

2004

Language

EN