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About this Engineering article
Crystallization of amorphous GexSi1−x films on SiO2 by F. Edelman; Y. Komem; S.S. Iyer; J. Heydenreich; D. Baither is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- F. Edelman; Y. Komem; S.S. Iyer; J. Heydenreich; D. Baither
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 1992
- Language
- EN
- Field
- Engineering (Physical Sciences)
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