About this scholarly article

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Interferometry XIV: Techniques and Analysis - Wide dynamic beam size range lateral-shear interferometer by Hii, K. U.; Schmit, Joanna; Creath, Katherine; Kwek, K. H.; Towers, Catherine E. is a scholarly article available to read on EtoBox.

Author

Hii, K. U.; Schmit, Joanna; Creath, Katherine; Kwek, K. H.; Towers, Catherine E.

Publisher

SPIE

Published

2008