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About this Engineering article
Low-temperature growth and interface characterization of BiFeO3 thin films with reduced leakage current by Lee, Yi-Hsien; Wu, Jenn-Ming; Chueh, Yu-Lun; Chou, Li-Jen is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Lee, Yi-Hsien; Wu, Jenn-Ming; Chueh, Yu-Lun; Chou, Li-Jen
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2005
- Language
- EN
- Field
- Engineering (Physical Sciences)
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