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This document provides a guide for X-ray photoelectron spectroscopy (XPS) data analysis, focusing on the application of constraints to synthetic peaks during peak fitting. It emphasizes that optimal peak fitting requires matching the peak shape to the underlying data and applying constraints to prevent unphysical results, even if this leads to higher residual standard deviations. The authors present case studies demonstrating the importance of using appropriate synthetic peak shapes and constraints in achie

Author

Vince Óvári

Language

EN