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About this Engineering article

Two-photon Optical-beam-induced Current Solid-immersion Imaging of a Silicon Flip Chip with a Resolution of 325 Nm by Ramsay, E.; Pleynet, N.; Xiao, D.; Warburton, R. J.; Reid, D. T. is a Engineering article available to read on EtoBox.

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Author
Ramsay, E.; Pleynet, N.; Xiao, D.; Warburton, R. J.; Reid, D. T.
Publisher
Optical Society of America; The Optical Society (ISSN 0146-9592)
Published
2005
Field
Engineering (Physical Sciences)