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About this Engineering article
Experimental analysis of residual stresses in semiconductor materials : 38267 Chambonnet, D.; Gauthier, R.; M'Ghaieth, R.; Pinard, P. Residual Stresses in Science and Technology. Proceedings of the International Conference, Garmisch-Partenkirchen (FRG), Oct. 1986. pp. 343–352. Deutsche Gesellschaft fur Metallkunde, 1059 pp. (1987) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Butterworth Scientific Ltd.; Elsevier BV (ISSN 0308-9126)
- Published
- 1990
- Language
- EN
- Field
- Engineering (Physical Sciences)