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About this Engineering article
Hardware-Software Subsystem for MOSFETs Characteristic Measurement and Parameter Extraction with Account for Radiation Effects by Petrosyants, Konstantin O.; Kharitonov, Igor A.; Sambursky, Lev M. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Petrosyants, Konstantin O.; Kharitonov, Igor A.; Sambursky, Lev M.
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications (ISSN 1662-8958)
- Published
- 2013
- Field
- Engineering (Physical Sciences)
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