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About this Engineering article
Width Dependence of Inherent TM-Mode Lateral Leakage Loss in Silicon-On-Insulator Ridge Waveguides by Webster, M.A.; Pafchek, R.M.; Mitchell, A.; Koch, T.L. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Webster, M.A.; Pafchek, R.M.; Mitchell, A.; Koch, T.L.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1041-1135)
- Published
- 2007
- Field
- Engineering (Physical Sciences)
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