Opening book details…
About this Engineering article
The Study of Defects Induced by the Implantation of O Ions into GaAs by a Slow Positron Beam by Fujii, S.; Wei, Long; Tanigawa, Shoichiro is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Fujii, S.; Wei, Long; Tanigawa, Shoichiro
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 1993
- Field
- Engineering (Physical Sciences)
More by Fujii, S.; Wei, Long; Tanigawa, Shoichiro
Browse all works by Fujii, S.; Wei, Long; Tanigawa, Shoichiro