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Modeling and mitigation of sample relief effects applied to chemistry measurements by the Mars Science Laboratory Alpha Particle X-ray Spectrometer by VanBommel, Scott J.; Gellert, Ralf; Berger, Jeff A.; Thompson, Lucy M.; Edgett, Kenneth S.; McBride, Marie J.; Minitti, Michelle E.; Boyd, Nicholas I.; Campbell, John L. is a Physics and Astronomy article available to read on EtoBox.

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Author
VanBommel, Scott J.; Gellert, Ralf; Berger, Jeff A.; Thompson, Lucy M.; Edgett, Kenneth S.; McBride, Marie J.; Minitti, Michelle E.; Boyd, Nicholas I.; Campbell, John L.
Publisher
John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0049-8246)
Published
2017
Language
EN
Field
Physics and Astronomy (Physical Sciences)

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