About this scholarly article

VLSI Design, Automation and Test(VLSI-DAT) - An algorithmic error-resilient scheme for robust LDPC decoding by Li, Huai-Ting; Lee, Ding-Yuan; Chen, Kun-Chih; Wu, An-Yeu Andy is a scholarly article available to read on EtoBox.

Author

Li, Huai-Ting; Lee, Ding-Yuan; Chen, Kun-Chih; Wu, An-Yeu Andy

Publisher

IEEE

Published

2015

Language

EN