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About this Computer Science article
A Sequential Circuit Structure with Combinational Test Generation Complexity and Its Application by Hideo Fujiwara; Satoshi Ohtake; Tomoya Takasaki is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Hideo Fujiwara; Satoshi Ohtake; Tomoya Takasaki
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0882-1666)
- Published
- 1997
- Language
- EN
- Field
- Computer Science (Physical Sciences)
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