About this scholarly article

2015 IEEE 11th International Conference on Power Electronics and Drive Systems - Modeling the effect of acceptor-type traps on internal electric field of a GaN-pin device phenomenon by Chiu, Shao-Yen; Tseng, Yu-Teng; Yang, Wei-Chen; Cheng, Keh-Yung Norman is a scholarly article available to read on EtoBox.

Author

Chiu, Shao-Yen; Tseng, Yu-Teng; Yang, Wei-Chen; Cheng, Keh-Yung Norman

Publisher

IEEE

Published

2015

Language

EN