About this scholarly article

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Optical fiber power measurement using different transfer standards by Han, Sen; Yoshizawa, Toru; Zhang, Song; Xu, Nan; Gan, Haiyong; Li, Jianwei; Zhang, Zhixin; Li, Jian is a scholarly article available to read on EtoBox.

Author

Han, Sen; Yoshizawa, Toru; Zhang, Song; Xu, Nan; Gan, Haiyong; Li, Jianwei; Zhang, Zhixin; Li, Jian

Publisher

SPIE

Published

2014

Language

EN