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Carta Kawalan X-R: Analisis Data by Mohd Nazri Salim is a document available to read on EtoBox.

What is Carta Kawalan X-R: Analisis Data about?

1. The document presents data on the thickness (in mm) of samples from a manufacturing process that were measured at different times. The data is shown in a table with measurements from 25 samples across 4 trials each. 2. The document calculates the mean, range, and standard deviation of the thickness measurements and establishes control limits above and below the mean based on statistical process control formulas. 3. Control charts are constructed from the data to monitor the manufacturing process and

Author

Mohd Nazri Salim

Language

EN