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Thickness-Dependent Domain Relaxation Dynamics Study in Epitaxial K0.5Na0.5NbO3 Ferroelectric Thin Films by Pradhan, Soumen (author);Rath, Martando (author);David, Adrian (author);Kumar, Deepak (author);Prellier, Wilfrid (author);Rao, M. S. Ramachandra (author) is a Engineering article available to read on EtoBox.
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- Author
- Pradhan, Soumen (author);Rath, Martando (author);David, Adrian (author);Kumar, Deepak (author);Prellier, Wilfrid (author);Rao, M. S. Ramachandra (author)
- Publisher
- American Chemical Society (ACS)
- Published
- 2021
- Field
- Engineering (Physical Sciences)