About this Engineering article
Traceable thickness determination of organic nanolayers by X‐ray reflectometry by Wernecke, Jan; Shard, Alexander G.; Krumrey, Michael is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wernecke, Jan; Shard, Alexander G.; Krumrey, Michael
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)
- Published
- 2014
- Field
- Engineering (Physical Sciences)