About this scholarly article

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - FakeFault: a silicon debug software tool for microprocessor embedded memory arrays by Young-Jun Kwon, ; Mathew, B.; Hong Hao, is a scholarly article available to read on EtoBox.

Author

Young-Jun Kwon, ; Mathew, B.; Hong Hao,

Publisher

Int. Test Conference

Published

1998

Language

EN