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1 TH6Paper ComprehensiveFull ChipMethodologytoVerifyElectromigration v2 by Ser is a document available to read on EtoBox.

What is 1 TH6Paper ComprehensiveFull ChipMethodologytoVerifyElectromigration v2 about?

The document presents a comprehensive methodology for verifying electromigration (EM) and dynamic voltage drop in high-performance FPGA designs at the 20nm technology node. It highlights the inadequacies of traditional power supply analysis methods and introduces a co-simulation framework for integrated analysis of power noise and reliability verification. The methodology aims to enhance the accuracy and efficiency of full-chip design sign-off by addressing the complexities of modern FPGA designs.

Author

Ser

Language

EN