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About this Engineering article
A robust indicator based on SVD for flaw feature detection from noisy ultrasonic signals by Cui, Ximing; Wang, Zhe; Kang, Yihua; Pu, Haiming; Deng, Zhiyang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Cui, Ximing; Wang, Zhe; Kang, Yihua; Pu, Haiming; Deng, Zhiyang
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics and the Physical Society (ISSN 0957-0233)
- Published
- 2018
- Language
- EN
- Field
- Engineering (Physical Sciences)