About this scholarly article

2019 IEEE 23rd Workshop on Signal and Power Integrity (SPI) - Study of the coupling of wide band Near Field Scan probe dedicated to the investigation of the radiated immunity of Printed Circuit Boards by DURIER, Andre; BEN DHIA, Sonia; DUBOIS, Tristan is a scholarly article available to read on EtoBox.

Author

DURIER, Andre; BEN DHIA, Sonia; DUBOIS, Tristan

Publisher

IEEE

Published

2019

Language

EN