About this scholarly article

1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record - Process dependence of the capacitance of silicon microstrip detectors by Wheadon, R.; Tonelli, G.; Bilei, G.-M.; Bartalini, P.; Hall, G. is a scholarly article available to read on EtoBox.

Author

Wheadon, R.; Tonelli, G.; Bilei, G.-M.; Bartalini, P.; Hall, G.

Publisher

IEEE

Published

1995