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Can I read Formation of Microcracks in Heavily Drawn and Annealed Tungsten on EtoBox?
Formation of Microcracks in Heavily Drawn and Annealed Tungsten by L. Uray,; I. Gaal, is a Engineering article available to read on EtoBox.
What is Formation of Microcracks in Heavily Drawn and Annealed Tungsten about?
The length of heavily drawn non-sag tungsten wires decreases upon free-end torsion, because the slip along the split grain boundaries reduces the length of the samples. The splitting of the grain boundaries upon torsion is preceded by the formation and propagation of Luders bands, and the local variation of the strain at the boundaries of these bands gives rise to internal stresses which promote the splitting of the grain boundaries. When the internal stresses produced by the drawing operation are relieved by a suitable annealing (carried out between 1200 and 1800 K), then the plastic twist is more or less homogeneous along the wires, the twisted sample remains crack-free and the length of the sample increases upon free-end torsion in accordance with the crystallographic texture.
Who reads Formation of Microcracks in Heavily Drawn and Annealed Tungsten?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- L. Uray,; I. Gaal,
- Publisher
- Walter de Gruyter GmbH
- Published
- 1994
- Language
- EN
- Field
- Engineering (Physical Sciences)