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Can I read Simulation of relationships between substrate XRF intensities and film thicknesses on EtoBox?
Simulation of relationships between substrate XRF intensities and film thicknesses by Qinmin Fan is a Physics and Astronomy article available to read on EtoBox.
What is Simulation of relationships between substrate XRF intensities and film thicknesses about?
## Abstract A Monte Carlo method was used to simulate relationships between substrate XRF intensities and film thicknesses for nickel film– and tin film–substrate systems. Experimental measurements of these relationships were performed for a few film–substrate systems. Good agreement between simulated and experimental values was obtained.
Who reads Simulation of relationships between substrate XRF intensities and film thicknesses?
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Qinmin Fan
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0049-8246)
- Published
- 1993
- Language
- EN
- ISBN
- 9781300220107
- Field
- Physics and Astronomy (Physical Sciences)