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About this Engineering article
A Class of Efficient Tests for Increasing-failure-rate-average Distribution Under Random Censoring by Tiwari, R.C.; Zalkikar, J.N. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Tiwari, R.C.; Zalkikar, J.N.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9529)
- Published
- 1992
- Language
- EN
- Field
- Engineering (Physical Sciences)