About this scholarly article

International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Breakdown and low-temperature anomalous effects in 6H SiC JFETs by Meneghesso, G.; Bartolini, A.; Verzellesi, G.; Cavallini, A.; Castaldini, A.; Canali, C.; Zanoni, E. is a scholarly article available to read on EtoBox.

Author

Meneghesso, G.; Bartolini, A.; Verzellesi, G.; Cavallini, A.; Castaldini, A.; Canali, C.; Zanoni, E.

Publisher

IEEE

Published

1998

Language

EN