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Can I read A Deep Learning Based Light-Weight Face Mask Detector With Residual Context Attention and Gaussian Heatmap to Fight Against COVID-19 on EtoBox?

A Deep Learning Based Light-Weight Face Mask Detector With Residual Context Attention and Gaussian Heatmap to Fight Against COVID-19 by Fan, Xinqi (author);Jiang, Mingjie (author);Yan, Hong (author) is a Engineering article available to read on EtoBox.

What is A Deep Learning Based Light-Weight Face Mask Detector With Residual Context Attention and Gaussian Heatmap to Fight Against COVID-19 about?

Coronavirus disease 2019 has seriously affected the world. One major protective measure for individuals is to wear masks in public areas. Several regions applied a compulsory mask-wearing rule in public areas to prevent transmission of the virus. Few research studies have examined automatic face mask detection based on image analysis. In this paper, we propose a deep learning based single-shot light-weight face mask detector to meet the low computational requirements for embedded systems, as well as achieve high performance. To cope with the low feature extraction capability caused by the light-weight model, we propose two novel methods to enhance the model's feature extraction process. First, to extract rich context information and focus on crucial face mask related regions, we propose a novel residual context attention module. Second, to learn more discriminating features for faces with and without masks, we introduce a novel auxiliary task using synthesized Gaussian heat map regression. Ablation studies show that these methods can considerably boost the feature extraction ability and thus increase the final detection performance. Comparison with other models shows that the propo

Who reads A Deep Learning Based Light-Weight Face Mask Detector With Residual Context Attention and Gaussian Heatmap to Fight Against COVID-19?

It is typically read by researchers, students, and practitioners in Engineering.

Author
Fan, Xinqi (author);Jiang, Mingjie (author);Yan, Hong (author)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Published
2021
Language
EN
Field
Engineering (Physical Sciences)

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