About this scholarly article

SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes - Wavefront error budget and optical manufacturing tolerance analysis for 1.8m telescope system by Wei, Kai; Jiang, Wenhan; Cho, Myung K.; Zhang, Xuejun; Xian, Hao; Wu, Fan; Rao, Changhui; Zhang, Yudong is a scholarly article available to read on EtoBox.

Author

Wei, Kai; Jiang, Wenhan; Cho, Myung K.; Zhang, Xuejun; Xian, Hao; Wu, Fan; Rao, Changhui; Zhang, Yudong

Publisher

SPIE

Published

2010

Language

EN