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This article discusses the characterization and modeling of MOSFET series resistance (๐น๐บ๐ซ) down to 4 K, highlighting its significance as channel lengths decrease. The authors present a new temperature-dependent model for ๐น๐บ๐ซ, addressing the anomalous behavior observed at low temperatures due to dopant freeze-out and mobility changes. The study demonstrates effective extraction methods for ๐น๐บ๐ซ and provides experimental data supporting the model
- Author
- Candy 49
- Language
- EN