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About this Materials Science article
A Slope‐Adapted Sample‐Tilting Method for Profile Measurement of Microstructures with Steep Surfaces by Fang, Hui; Xu, Bin; Chen, Wei; Tang, Hairong; Zhao, Shiping is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Fang, Hui; Xu, Bin; Chen, Wei; Tang, Hairong; Zhao, Shiping
- Publisher
- Hindawi Publishing Corporation; Hindawi Limited; [New York N.Y.]: Hindawi, 2006-; London: Hindawi (ISSN 1687-4110)
- Published
- 2015
- Field
- Materials Science (Physical Sciences)
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