About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Imaging Spectrometry XX - Characterizing intimate mixtures of materials in hyperspectral imagery with albedo-based and kernel-based approaches by Pagano, Thomas S.; Silny, John F.; Rand, Robert S.; Resmini, Ronald G.; Allen, David W. is a scholarly article available to read on EtoBox.

Author

Pagano, Thomas S.; Silny, John F.; Rand, Robert S.; Resmini, Ronald G.; Allen, David W.

Publisher

SPIE

Published

2015