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Nanostructures produced by SPM voltage ramping in metal oxide films by V. Bukauskas; A. Mironas; A. Šetkus; V. Strazdienė is a Engineering article available to read on EtoBox.

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## Abstract In metal oxide film‐based nanosystems, the changes were produced and investigated by a scanning probe microscope (SPM). It is demonstrated that nanograins can be formed on the surfaces of ultrathin films (4 ÷ 10 nm) based on tin and indium oxides by the SPM electrical mode if the SPM tip is kept still on the surface and the bias voltage applied to the film is negative. In contrast to this, the positive bias voltage does not result in detectable changes of the film structures. The traceable transformations of the films are obtained only if the bias voltage exceeds a critical magnitude equal to about 2–3 V in SnO~2~ and about 5 V in In~2~O~3~. The nanograins are typically larger after a longer period of the electrical influence (typically 3 ÷ 5 min). The short‐term SPM analysis of the metal oxide surfaces during which a bias voltage is applied to the sample does not destroy the structure of the films in the tested points. The formation is faster and the nanogains are larger in the atmospheres with reduced amount of oxygen, e.g. in pure nitrogen, or with reducing gas, e.g. CO in air. The irreversible changes of the structure are shown being related to the hysteresis of vol

Who reads Nanostructures produced by SPM voltage ramping in metal oxide films?

Author

V. Bukauskas; A. Mironas; A. Šetkus; V. Strazdienė

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)

Published

2010

Language

EN

Field

Engineering (Physical Sciences)